Migration from PLC to IEC 61499 using Semantic Web Technologies
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Other Title
Authors
Dai, Wenbin
Dubinin, V.N.
Vyatkin, V.
Dubinin, V.N.
Vyatkin, V.
Author ORCID Profiles (clickable)
Degree
Grantor
Date
2014-03
Supervisors
Type
Journal Article
Ngā Upoko Tukutuku (Māori subject headings)
Keyword
IEC 61131-3 PLC
IEC 61499 Function Blocks
migration (computers)
ontology (OWL)
execution semantics
ontology mapping
Code Generation and IEC 61131-3 formal execution model
semantic web
airport baggage handling
IEC 61499 Function Blocks
migration (computers)
ontology (OWL)
execution semantics
ontology mapping
Code Generation and IEC 61131-3 formal execution model
semantic web
airport baggage handling
ANZSRC Field of Research Code (2020)
Citation
Dai, W., Dubinin, V., and Vyatkin, V. (2013). Migration from PLC to IEC 61499 using Semantic Web Technologies. IEEE Transactions on Systems, Man, Cybernetics, Part C: Applications and Review. 44(3), 277-291.
Abstract
This paper proposes a new methodology of migration from IEC 61131-3 PLCs to IEC 61499 function blocks. The aim of this migration process is to recreate IEC 61131-3 applications in IEC 61499 implementations with equivalent execution behavior. The formal model of the IEC 61131-3 standard for migration and cyclical execution model is defined. This method also creates a foundation for correct-by-design development tools and automatic migration between the IEC 61131-3 and IEC 61499 standard. Formal migration rules based on ontology mappings, restoring execution model including tasks and programs scheduling and variables mapping with different access levels, are provided. A transformation engine for importing PLC code, mapping from PLC ontology model to function block model and code generation is implemented based on the ontological knowledge base and semantic query-enhanced web rule language. The migration approach is demonstrated on a simple airport baggage handling system.
Publisher
IEEE
Permanent link
Link to ePress publication
DOI
10.1109/TSMCC.2013.2264671
Copyright holder
Institute of Electrical and Electronics Engineers
Copyright notice
All rights reserved